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US Patent Issued to Siemens on Oct. 27 for "Machine learning model for automatically detecting faults using optical inspection" (German Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,020, issued on Oct. 27, was assigned to Siemens AG (Munich). "Machine learning model for automatically detecting faults using optical inspe... Read More


US Patent Issued to Pictometry International on Oct. 27 for "Roof condition assessment using machine learning" (Washington Inventor)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,021, issued on Oct. 27, was assigned to Pictometry International Corp. (Rochester, N.Y.). "Roof condition assessment using machine learning... Read More


US Patent Issued to Applied Materials Israel on Oct. 27 for "Optimization of a metrology algorithm for examination of semiconductor specimens" (Israeli Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,022, issued on Oct. 27, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel). "Optimization of a metrology algorithm for examina... Read More


US Patent Issued to Rolls-Royce, Rolls-Royce North American Technologies on Oct. 27 for "Microstructural layering of thermal spray coating" (Indiana Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,023, issued on Oct. 27, was assigned to Rolls-Royce Corp. (Indianapolis) and Rolls-Royce North American Technologies Inc. (Indianapolis). "... Read More


US Patent Issued to FUJIFILM Business Innovation on Oct. 27 for "Image inspection system that identifies defective regions" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,024, issued on Oct. 27, was assigned to FUJIFILM Business Innovation Corp. (Tokyo). "Image inspection system that identifies defective regi... Read More


US Patent Issued to ASML Netherlands on Oct. 27 for "Method and system for anomaly-based defect inspection" (California Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,025, issued on Oct. 27, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Method and system for anomaly-based defect inspect... Read More


US Patent Issued to Siemens on Oct. 27 for "Computer-implemented method and tool for optical quality control of intermediate or end products of production installations, and production installation controller" (German Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,026, issued on Oct. 27, was assigned to Siemens AG (Munich). "Computer-implemented method and tool for optical quality control of intermedi... Read More


US Patent Issued to Optum Services (Ireland) on Oct. 27 for "Predictive data analysis techniques using a hierarchical risk prediction machine learning framework" (American, British, Irish Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,027, issued on Oct. 27, was assigned to Optum Services (Ireland) Ltd. (Dublin). "Predictive data analysis techniques using a hierarchical r... Read More


US Patent Issued to SHANGHAI UNITED IMAGING HEALTHCARE on Oct. 27 for "Methods and systems for image acquisition, image quality evaluation, and medical; image acquisition" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,028, issued on Oct. 27, was assigned to SHANGHAI UNITED IMAGING HEALTHCARE Co. LTD. (Shanghai). "Methods and systems for image acquisition,... Read More


US Patent Issued to Oregon Health & Science University on Oct. 27 for "Systems and methods for generating biomarker activation maps" (Oregon Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,029, issued on Oct. 27, was assigned to Oregon Health & Science University (Portland, Ore.). "Systems and methods for generating biomarker ... Read More